Tai-Hsiang Lai, : rechercher sur Z-Library

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1

Plasma-Assisted Synthesis of High-Mobility Atomically Layered Violet Phosphorus

Tsai, Hsu-Sheng, Lai, Chih-Chung, Hsiao, Ching-Hung, Medina, Henry, Su, Teng-Yu, Ouyang, Hao, Chen, Tai-Hsiang, Liang, Jenq-Horng, Chueh, Yu-Lun

Journal:

ACS Applied Materials & Interfaces

Année:

2015

Langue:

english

Fichier:

PDF, 2.73 MB

english, 2015

2

Two-photon absorption chromophores with a tunable [2,2′]bithiophene core

Chia-Feng Chou, Tai-Hsiang Huang, Jiann T. Lin, Cheng-chih Hsieh, Chin-Hung Lai, Pi-Tai Chou, Chiitang Tsai

Journal:

Année:

2006

Langue:

english

Fichier:

PDF, 300 KB

english, 2006

3

Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology

Ming-Dou Ker, Tai-Hsiang Lai

Journal:

IEEE Transactions on Electromagnetic Compatibility

Année:

2008

Langue:

english

Fichier:

PDF, 1.97 MB

english, 2008

4

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - The modified P+ electrode layout schemes to enhance esd robustness of SCR structure for PMIC applications

Chen, Lu-An, Wang, Chang-Tzu, Lai, Tai-Hsiang, Tang, Tien-Hao, Su, Kuan-Cheng

Année:

2011

Langue:

english

Fichier:

PDF, 389 KB

english, 2011

5

[IEEE 2006 IEEE International Integrated Reliability Workshop Final Report - South Lake Tahoe, CA, USA (2006.10.16-2006.09.19)] 2006 IEEE International Integrated Reliability Workshop Final Report - ESD Robustness of 40-V CMOS Devices With/Without Drift Implant

Chang, Wei-jen, Ker, Ming-dou, Lai, Tai-hsiang, Tang, Tien-hao, Su, Kuan-cheng

Année:

2006

Langue:

english

Fichier:

PDF, 240 KB

english, 2006

6

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - High-robust ESD protection structure with embedded SCR in high-voltage CMOS process

Tai-Hsiang Lai,, Ming-Dou Ker,, Wei-Jen Chang,, Tien-Hao Tang,, Kuan-Cheng Su,

Année:

2008

Langue:

english

Fichier:

PDF, 645 KB

english, 2008

7

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Design of modified ESD protection structure with low-trigger and high-holding voltage in embedded high voltage CMOS process

Lai, Tai-Hsiang, Chen, Lu-An, Tang, Tien-Hao, Su, Kuan-Cheng

Année:

2011

Langue:

english

Fichier:

PDF, 1.87 MB

english, 2011

8

9.3: The First Flexible Liquid Crystal Display Applied for Wearable Smart Device

Li, Wen-Yuan, Chiu, Pin-Hsiang, Huang, Tai-Hsiang, Lu, Jen-kuei, Lai, Yi-Hsiang, Huang, Yu-Sheng, Chuang, Chin-Tang, Yeh, Cheng-Nan, Sugiura, Norio

Journal:

SID Symposium Digest of Technical Papers

Année:

2015

Langue:

english

Fichier:

PDF, 556 KB

english, 2015

9

Efficacy of cheap amendments for stabilizing trace elements in contaminated paddy fields

Huang, Tai-Hsiang, Lai, Yun-Jie, Hseu, Zeng-Yei

Journal:

Année:

2018

Langue:

english

Fichier:

PDF, 762 KB

english, 2018

10

Investigating Asian Parti-colored bats using the BatTalk internet of things approach

Lin, Yun-Wei, Yen, Tai-Hsiang, Chou, Cheng-Han, Lin, Yi-Bing, Lai, Wen-Shu

Journal:

Journal of Network and Computer Applications

Année:

2020

Fichier:

PDF, 269 KB

2020